The C-2 is a very cost-effective, smallest, lightest, good mobility and highly-precise manual probe system for wafers and substrates of 50mm or less. It supports a lot of applications such as C-V/I-V, 2 port /4 port RF, 2 port/4 port mm-Wave(DC to 67GHz) measurements, device and wafer tests, failure analysis, thin film probing, submicron probing, optoelectronic engineering tests etc. It could support up to 6 manipulators for DC measurement and support 4 port RF/mm-Wave measurement.
Component such as the raised platen, Coaxial X-Y stage and digital microscope mount are included with station. Vibration free base provide nice stability measurement. It is the basic part of providing good electrical measurement results come from a stable test platform.
