C-4 is an economical and affordable, high precision, excellent stability, widely used in various fields manual probe measurement platform. Low-Profile, balanced weight and vibration free base design provides the most stable measurement environment for wafers and substrates of 100mm or less. It supports a lot of applications such as C-V/I-V, 2 port /4 port RF, 2 port/4 port mm-Wave(DC to 67GHz, DC to 145GHz for Anritsu VNA) measurements, device and wafer tests, failure analysis, thin film probing, submicron probing, optoelectronic engineering tests etc. It could support up to 12 manipulators for DC measurement and support 4 port RF/mm-Wave measurement.
C-4 has nice stability system platform design with a vibration free base solution to provide contact high quality over measurement time to help you having accuracy test data. Sub- micron positioning, backlash-free and X-Y-Z linear movement of micropositioners enable precise probe placement.
6 inch upgradeable, single-handed chuck adjustment, highly-planar chuck surface, 10 micron resolution, backlash-free and X-Y-Z linear movement, ensures ease of operation for both the novice and the expert user.
—4” Steel Chuck with Vacuum Switches
— 4” or less wafers
—Coaxial Stage with 4”-4” linear back-lash free travel —Fine positioning at ~10 micron resolution
—Quick motion at ~25mm drive per revolution —Chuck theta at 15 degree backlash free
—Chuck up/down 4 mm
—Compact size and Light weight
—Idea for wafers of less than 4”
—IV/CV measurements applications
—RF probing (EAST/WEST/North/South Configuration) —Coaxial Chuck X-Y stage
—Linear backlash free motion
—Low-Profile design for stability
—One hand only grips both X-Y knobs
—One stage only for the fine and quick positioning
—500mmW x 450mmD x 550mmH with Microscope —Weight 30Kg with Microscope (C-4)
—Weight 32Kg with Microscope (C-6)